#96
Expulsion of runaway electrons using ECRH in the TCV tokamak
Oral
Joan Decker (EPFL)
M Hoppe, U Sheikh, B P Duval, G Papp, L Simons, T Wijkamp, A Battey, W Bin, J Cazabonne, H Choudhury, S Coda, E Devlaminck, O Ficker, R Hellinga, U Kumar, R Kwiatkowski, F Napoli, A Perek, L Porte, C Reux, Y Savoye-Peysson, C Sommariva, A Tema Biwolé, B Vincent, L Votta
Abstract
Runaway electrons (REs) are a concern for tokamak fusion reactors from discharge startup to termination. A sudden localized loss of a multi-megaampere RE beam can inflict severe damage to the first wall. Should a
disruption occur, the existence of a RE seed may play a significant role in the formation of a RE beam and the magnitude of its current. The application of central electron cyclotron resonance heating (ECRH) in the Tokamak à Configuration Variable (TCV) reduces an existing RE seed population by up to three orders of magnitude within only a few hundred milliseconds. Applying ECRH can also prevent the formation of a post-disruption RE beam where it would otherwise be expected. The RE expulsion rate and consequent RE current reduction are found to increase with applied ECRH power. A simple 0-D model for the evolution of the RE population is presented that explains how the effective ECRH-induced RE expulsion results from the combined effects of reduced avalanche RE generation and enhanced RE transport.